Are you testing the Hosa ODL-276? Or is this the on you picked up from D?
[1] Open both files in SF
[2] Find roughly the same spot in each file *
[3] Zoom in bit by bit, re-adjusting to make sure you're looking at the same section as you zoom in
[4] When you get to the point where you can view the properties for each individual sample (at least this is how I do it in CEP), find a sample in one file and bounce around in the other file until you find the same sample
* I find it's easiest to pick a spot in the recording where there's a clear peak and then drill into the highest/lowest sample of that peak. As you zoom in, the difference between the highest/lowest peak is less and less noticable, but if you look very closely it's fairly easy to pick them out.